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eNauka >  Results >  Structural and microhardness characterization of thin electrodeposited Ni/Cu multilayers on copper substrates
Title: Structural and microhardness characterization of thin electrodeposited Ni/Cu multilayers on copper substrates
Authors: Lamovec, Jelena  ; Jović, Vesna ; Popović, Bogdan  ; Vasiljević-Radović, Dana  ; Aleksić, Radoslav ; Radojević, Vesna  
Issue Date: 2010
Publication: 27th International Conference on Microelectronics, MIEL 2010 - Proceedings
Type: Conference Paper
Collation: str. 213-216
DOI: 10.1109/MIEL.2010.5490498
Scopus-ID: 2-s2.0-77955240918
URI: https://cer.ihtm.bg.ac.rs/handle/123456789/755
https://enauka.gov.rs/handle/123456789/439730
http://TechnoRep.tmf.bg.ac.rs/handle/123456789/1536
URL: http://eds.ieee.org/conferences.html
Project: Mikrosistemske, nanosistemske tehnologije i komponente (RS-11027)
Dizajniranje nanokristalnih magnetnih materijala tipa (Nd,Pr)FeB i komponenti na bazi smart magnetnih materijala (RS-142035)
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