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| Title: | NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors | Authors: | Davidović, Vojkan   ; Danković, Danijel ; Ilic, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2016 | Publication: | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | ISSN: | 0018-9499 IEEE Transactions on Nuclear Science Search Idenfier |
Publisher: | United States : Institute of Electrical and Electronics Engineers | Type: | Article | Collation: | vol. 63 br. 2 str. 1268-1275 | DOI: | 10.1109/tns.2016.2533866 | WoS-ID: | 000375035800023 | Scopus-ID: | 2-s2.0-84964290783 | URI: | https://enauka.gov.rs/handle/123456789/467958 | Project: | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026] | Metadata source: | Migracija | M-category: | 21M21 |
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