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Simulated Effects of Proton and Ion Beam Irradiation on Titanium Dioxide Memristors
| Title: | Simulated Effects of Proton and Ion Beam Irradiation on Titanium Dioxide Memristors | Authors: | Vujisić, Miloš |
Issue Date: | 2010 | Publication: | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | ISSN: | 0018-9499 IEEE Transactions on Nuclear Science Search Idenfier |
Type: | Article | Collation: | vol. 57 br. 4 str. 1798-1804 | DOI: | 10.1109/tns.2010.2045512 | WoS-ID: | 000283074500009 | Scopus-ID: | 2-s2.0-77955822780 | URI: | https://enauka.gov.rs/handle/123456789/467960 http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/502543 |
Metadata source: | Migracija | M-category: | 21aM21a |
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