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Simulation of Bulk Traps Influence on the Electrical Characteristics of VDMOS Transistor
| Title: | Simulation of Bulk Traps Influence on the Electrical Characteristics of VDMOS Transistor | Authors: | Pantić, Dragan   ; Aleksić, Sanja ; Darko Bjelopavlic |
Issue Date: | 2011 | Publication: | XLVI International Scientific Conference on Information, Communication and Energy Systems and Technologies - ICEST 2011 | Publisher: | Faculty of Electronic Engineering, University of Niš, Srbija | Type: | Conference Paper | ISBN: | 978-86-6125-031-6  Search Idenfier |
Collation: | str. 271-274 | URI: | https://enauka.gov.rs/handle/123456789/470501 | URL: | http://www.mtt-serbia.org.rs/microwave_review/pdf/Vol17No1-08-ICEST%202011.pdf | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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