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Simulation of Bulk Traps Influence on the Electrical Characteristics of VDMOS Transistor
| Naziv: | Simulation of Bulk Traps Influence on the Electrical Characteristics of VDMOS Transistor | Autori: | Pantić, Dragan   ; Aleksić, Sanja ; Darko Bjelopavlic |
Godina: | 2011 | Publikacija: | XLVI International Scientific Conference on Information, Communication and Energy Systems and Technologies - ICEST 2011 | Izdavač: | Faculty of Electronic Engineering, University of Niš, Srbija | Tip rezultata: | Konferencijski rad | ISBN: | 978-86-6125-031-6  Pretraži identifikator |
Kolacija: | str. 271-274 | URI: | https://enauka.gov.rs/handle/123456789/470501 | URL: | http://www.mtt-serbia.org.rs/microwave_review/pdf/Vol17No1-08-ICEST%202011.pdf | Izvor metapodataka: | Migrirano iz RIS podataka | M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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