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Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs
| Title: | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs | Authors: | Danković, Danijel   ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2013 | Publication: | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS | ISSN: | 0352-9045 Informacije Midem. Journal of Microelectronics, Electric Components and Materials Search Idenfier |
Publisher: | Slovenia : MIDEM Society | Type: | Article | Collation: | vol. 43 br. 1 str. 58-66 | WoS-ID: | 000318180100008 | URI: | https://enauka.gov.rs/handle/123456789/472151 http://www.midem-drustvo.si/Journal%20papers/MIDEM_43%282013%291p58.pdf |
URL: | http://www.midem-drustvo.si/Journal%20papers/MIDEM_43%282013%291p58.pdf | Project: | Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026] Ei PCB Factory, Nis, Serbia |
Metadata source: | Migracija | M-category: | 23M23 |
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