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| Title: | Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films | Authors: | Čajko, Kristina O.   ; Svetlana Lukić-Petrović ; Tomas Wagner; Jan Prikryl; Dragoslav Petrović |
Issue Date: | 2017 | Publication: | NANOENERGY 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications Abstract Book, 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, NANOENERGY 2017, Helsinki, Finland, 2017, 26-28 July | Publisher: | Aalto University, Finland, Aalto, Finland | Type: | Conference Paper | Collation: | str. 8-8 | URI: | https://www.cris.uns.ac.rs/record.jsf?recordId=105717&source=eNauka&language=en https://enauka.gov.rs/handle/123456789/481182 |
Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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