Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films

Čajko, Kristina O.; Svetlana Lukić-Petrović; Tomas Wagner; Jan Prikryl; Dragoslav Petrović

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eNauka > Results > Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films

Title:	Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films
Authors:	Čajko, Kristina O. ; Svetlana Lukić-Petrović ; Tomas Wagner; Jan Prikryl; Dragoslav Petrović
Issue Date:	2017
Publication:	NANOENERGY 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications Abstract Book, 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, NANOENERGY 2017, Helsinki, Finland, 2017, 26-28 July
Publisher:	Aalto University, Finland, Aalto, Finland
Type:	Conference Paper
Collation:	str. 8-8
URI:	https://www.cris.uns.ac.rs/record.jsf?recordId=105717&source=eNauka&language=en https://enauka.gov.rs/handle/123456789/481182
Metadata source:	Migracija
M-category:	Mp. category will be shown later

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