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The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet
| Title: | The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet | Authors: | Đorić-Veljković, Snežana   ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2013 | Publication: | NUCLEAR TECHNOLOGY & RADIATION PROTECTION | ISSN: | 1451-3994 Nuclear technology and radiation protection Search Idenfier |
Publisher: | Belgrade : Vinča Institute of Nuclear Sciences | Type: | Article | Collation: | vol. 28 br. 4 str. 406-414 | DOI: | 10.2298/ntrp1304406d | WoS-ID: | 000331597400008 | Scopus-ID: | 2-s2.0-84894624718 | URI: | https://enauka.gov.rs/handle/123456789/534486 | Project: | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI171026] | Metadata source: | Migracija | M-category: | 22M22 |
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