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Radiation characteristics for HFO2 and SIO2 incorporated in electronic component with mos structure in fields of gamma and x-radiation
| Title: | Radiation characteristics for HFO2 and SIO2 incorporated in electronic component with mos structure in fields of gamma and x-radiation | Authors: | Stanković, Srboljub J. |
Issue Date: | 2018 | Publication: | RAD 2018 : 6th International Conference on Radiation in Various Fields of Research : Book of abstracts | Publisher: | Niš, Serbia : RAD Centre | Type: | Conference Paper | ISBN: | 978-86-80300-03-0 Search Idenfier |
Collation: | str. 247-247 | URI: | https://enauka.gov.rs/handle/123456789/549925 https://vinar.vin.bg.ac.rs/handle/123456789/11190 |
Metadata source: | Migracija Migrirano iz RIS podataka |
M-category: | Mp. category will be shown later |