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Radiation characteristics for HFO2 and SIO2 incorporated in electronic component with mos structure in fields of gamma and x-radiation
| Naziv: | Radiation characteristics for HFO2 and SIO2 incorporated in electronic component with mos structure in fields of gamma and x-radiation | Autori: | Stanković, Srboljub J.   ; Jankšić, Aleksandar; Radenković, Mirjana ; Nikolić, Dragana J. ; Krzanović, Nikola Lj. |
Godina: | 2018 | Publikacija: | RAD 2018 : 6th International Conference on Radiation in Various Fields of Research : Book of abstracts | Izdavač: | Niš, Serbia : RAD Centre | Tip rezultata: | Konferencijski rad | ISBN: | 978-86-80300-03-0  Pretraži identifikator |
Kolacija: | str. 247-247 | URI: | https://enauka.gov.rs/handle/123456789/549925 https://vinar.vin.bg.ac.rs/handle/123456789/11190 |
Izvor metapodataka: | Migracija Migrirano iz RIS podataka |
M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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