Rezultati
| Title: | Effects of Constant Voltage Stress in Hf-doped Ta2O5 Stacks | Authors: | Manić, Ivica   ; Elena Atanassova; Stojadinović, Ninoslav ; Dencho Spassov |
Issue Date: | 2010 | Publication: | International Conference on Microelectronics (MIEL 2010) | Publisher: | IEEE Serbia and Montenegro Section - ED/SSC Chapter, Srbija | Type: | Conference Paper | ISBN: | 978-1-4244-7198-0  Search Idenfier |
Collation: | str. 483-486 | DOI: | 10.1109/MIEL.2010.5490437 | Scopus-ID: | 2-s2.0-77955178256 | URI: | https://enauka.gov.rs/handle/123456789/557839 | URL: | http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5490437 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.