Results

eNauka >  Results >  Evaluation of thick-film resistor structural parameters based on noise index measurements
Title: Evaluation of thick-film resistor structural parameters based on noise index measurements
Authors: Jevtić, M. M.; Stanimirović, Zdravko  ; Stanimirović, Ivanka  
Issue Date: 2001
Publication: Microelectronics Reliability
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Publisher: Elsevier
Type: Article
Collation: vol. 41 br. 1 str. 59-66
DOI: 10.1016/s0026-2714(00)00207-9
WoS-ID: 000166353300009
Scopus-ID: 2-s2.0-0035151129
URI: https://enauka.gov.rs/handle/123456789/768938
Metadata source: (Preuzeto iz ORCID-a) Stanimirovic, Zdravko
M-category: 
22M22

14
SCOPUSTM
11
OpenCitations
15
WEB OF SCIENCETM
Altmetric
Dimensions
Unpaywall

Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.