Results
| Title: | High-voltage pulse stressing of thick-film resistors and noise | Authors: | Stanimirović, Ivanka   ; Jevtić, M. M.; Stanimirović, Zdravko |
Issue Date: | 2003 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | Elsevier | Type: | Article | Collation: | vol. 43 br. 6 str. 905-911 | DOI: | 10.1016/s0026-2714(03)00094-5 | WoS-ID: | 000183342500011 | Scopus-ID: | 2-s2.0-0038824189 | URI: | https://enauka.gov.rs/handle/123456789/768944 | Metadata source: | (Preuzeto iz ORCID-a) Stanimirovic, Zdravko | M-category: | 22M22 |
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