Rezultati
Title  : | Low-frequency noise in thick-film structures caused by traps in glass barriers | Authors: | Mrak, Ivanka   ; Jevtić, M. M.; Stanimirović, Zdravko |
Issue Date: | 1998 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | Elsevier | Type: | Article | Collation: | vol. 38 br. 10 str. 1569-1576 | DOI: | 10.1016/s0026-2714(98)00032-8 | WoS-ID: | 000077151400007 | Scopus-ID: | 2-s2.0-0009055428 | URI: | https://enauka.gov.rs/handle/123456789/768945 | Metadata source: | (Preuzeto iz ORCID-a) Stanimirovic, Zdravko | Availability note: | Пуни текст није јавно доступан | M-category: | 23M23 |
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