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Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell
| Title: | Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell | Authors: | Jevtić, Milan M.; Stanimirović, Zdravko   ; Mrak, Ivanka |
Issue Date: | 1999 | Publication: | IEEE Transactions on Components and Packaging Technologies | ISSN: | 1521-3331 IEEE Transactions on Components and Packaging Technologies Search Idenfier |
Publisher: | Institute of Electrical and Electronics Engineers - IEEE | Type: | Article | Collation: | vol. 22 br. 1 str. 120-125 | DOI: | 10.1109/6144.759361 | WoS-ID: | 000081031900019 | Scopus-ID: | 2-s2.0-0033308616 | URI: | https://enauka.gov.rs/handle/123456789/769024 https://vinar.vin.bg.ac.rs/handle/123456789/14330 |
Metadata source: | (Preuzeto iz ORCID-a) Stanimirovic, Zdravko | Availability note: | Пуни текст није доступан ни у електронској, ни у штампаној форми | M-category: | 21aM21a |
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