Results
| Title: | Characterization of irradiated and NBT stressed p-channel power VDMOSFETs | Authors: | Mitrović, Nikola   ; Veljković, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel |
Issue Date: | 2022 | Publication: | Book of Abstracts – RAD 2022 Conference (Spring Edition) | Publisher: | Niš, Serbia : RAD Centre | Type: | Conference Paper | ISBN: | 978-86-901150-4-4  Search Idenfier |
Collation: | vol. 6 str. 124 | DOI: | 10.21175/rad.spr.abstr.book.2022.27.10 | VBS COBISS: | 70851849 | URI: | https://enauka.gov.rs/handle/123456789/776662 | Metadata source: | (Preuzeto iz ORCID-a) Mitrovic, Nikola | M-category: | Mp. category will be shown later |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.