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eNauka >  Results >  Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications
Title: Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications
Authors: Mitrović, Nikola  ; Veljković, Sandra  ; Davidović, Vojkan  ; Đorić-Veljković, Snežana  ; Golubović, Snežana ; Živanović, Emilija  ; Prijić, Zoran  ; Danković, Danijel  
Issue Date: 2022
Publication: Microelectronics Reliability
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Publisher: United Kingdom : Elsevier B. V.
Type: Article
Collation: vol. 138 str. 114634-114634
DOI: 10.1016/j.microrel.2022.114634
WoS-ID: 000896860700013
Scopus-ID: 2-s2.0-85142430670
URI: https://enauka.gov.rs/handle/123456789/776663
Project: European Union [857558]
Republic of Serbia [451-03-9/2021-14/200102]
Metadata source: (Preuzeto iz ORCID-a) Mitrovic, Nikola
M-category: 
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