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Title: | Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs | Authors: | Veljković, Sandra ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() |
Issue Date: | 2023 | Publication: | RAD conference 2023 | Publisher: | {RAD} Centre | Type: | Conference Paper | DOI: | 10.21175/rad.abstr.book.2023.33.4 | URI: | https://enauka.gov.rs/handle/123456789/776664 | Metadata source: | (Preuzeto iz ORCID-a) Mitrovic, Nikola | M-category: | Mp. category will be shown later |
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