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eNauka >  Results >  Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs
Title: Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs
Authors: Veljković, Sandra  ; Mitrović, Nikola  ; Jovanović, Igor  ; Živanović, Emilija  ; Paskaleva, Albena; Ristić, Goran  ; Danković, Danijel  
Issue Date: 2023
Publication: RAD conference 2023
Publisher: {RAD} Centre
Type: Conference Paper
DOI: 10.21175/rad.abstr.book.2023.33.4
URI: https://enauka.gov.rs/handle/123456789/776664
Metadata source: (Preuzeto iz ORCID-a) Mitrovic, Nikola
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