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eNauka >  Results >  Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
Title: Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
Authors: Veljković, Sandra  ; Mitrović, Nikola  ; Đorić-Veljković, Snežana  ; Davidović, Vojkan  ; Manić, Ivica  ; Golubović, Snežana ; Paskaleva, Albena; Spassov, Dentcho; Prijić, Zoran  ; Prijić, Aneta  ;
Stanković, S.  ; Danković, Danijel  ;
Issue Date: 2021
Publication: 2021 IEEE 32nd International Conference on Microelectronics (MIEL)
Publisher: Nis, Serbia : IEEE
Type: Conference Paper
Collation: str. 345-350
DOI: 10.1109/miel52794.2021.9569154
WoS-ID: 001686589600076
Scopus-ID: 2-s2.0-85118457875
URI: https://vinar.vin.bg.ac.rs/handle/123456789/12119
https://enauka.gov.rs/handle/123456789/776671
URL: http://dx.doi.org/10.1109/miel52794.2021.9569154
Metadata source: (Preuzeto iz ORCID-a) Mitrovic, Nikola
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