Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors

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Naziv:	Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
Autori:	Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Paskaleva, Albena; Spassov, Dentcho; Prijić, Zoran ; Prijić, Aneta ; Stanković, S. ; Danković, Danijel ;
Godina:	2021
Publikacija:	2021 IEEE 32nd International Conference on Microelectronics (MIEL)
Izdavač:	Nis, Serbia : IEEE
Tip rezultata:	Konferencijski rad
Kolacija:	str. 345-350
DOI:	10.1109/miel52794.2021.9569154
WoS-ID:	001686589600076
Scopus-ID:	2-s2.0-85118457875
URI:	https://vinar.vin.bg.ac.rs/handle/123456789/12119 https://enauka.gov.rs/handle/123456789/776671
URL:	http://dx.doi.org/10.1109/miel52794.2021.9569154
Izvor metapodataka:	(Preuzeto iz ORCID-a) Mitrovic, Nikola
M-kategorija:	Mp kategorija će biti prikazana naknadno.

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