Rezultati

eNauka >  Results >  Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
Title: Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
Authors : Mitrović, Nikola  ; Ranđelović, Branislav  ; Danković, Danijel  ; Prijić, Zoran  ; Stojadinović, Ninoslav 
Issue Date: 2020
Publication: Informacije MIDEM - Journal of Microelectronics, Electronic Components and Materials
ISSN: 2232-6979 Informacije Midem. Journal of Microelectronics, Electric Components and Materials Search Idenfier
Publisher: Drustvo {MIDEM}
Type: Article
DOI: 10.33180/InfMIDEM2020.305
WoS-ID: 000592954500005
Scopus-ID: 2-s2.0-85102304976
URI: https://enauka.gov.rs/handle/123456789/776717
Project: Ministry of Education, Science and Technological Development of the Republic of Serbia
Serbian Academy of Science and Arts
Metadata source: (Preuzeto iz ORCID-a) Mitrovic, Nikola
M-category: 
23M23

6
SCOPUSTM
3
WEB OF SCIENCETM
Alt metrika
Dimensions
Unpaywall

Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.