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| Title: | Electrical stressing effects in commercial power VDMOSFETs | Authors: | Stojadinović, Ninoslav |
Issue Date: | 2006 | Publication: | IEE proceedings. Circuits, devices and systems | ISSN: | 1350-2409 IEE Proceedings: Circuits Devices and Systems Search Idenfier |
Publisher: | United Kingdom : IET | Type: | Article | Collation: | vol. 153 br. 3 str. 281-288 | DOI: | 10.1049/ip-cds:20050050 | WoS-ID: | 000239557500012 | Scopus-ID: | 2-s2.0-33745289583 | URI: | https://enauka.gov.rs/handle/123456789/797780 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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