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Title: Electrical stressing effects in commercial power VDMOSFETs
Authors: Stojadinović, Ninoslav ; Manić, Ivica  ; Davidović, Vojkan  ; Danković, Danijel  ; Đorić Veljković, Snežana  ; Golubović, Snežana ; Dimitrijev, Sima
Issue Date: 2006
Publication: IEE proceedings. Circuits, devices and systems
ISSN: 1350-2409 IEE Proceedings: Circuits Devices and Systems Search Idenfier
Publisher: United Kingdom : IET
Type: Article
Collation: vol. 153 br. 3 str. 281-288
DOI: 10.1049/ip-cds:20050050
WoS-ID: 000239557500012
Scopus-ID: 2-s2.0-33745289583
URI: https://enauka.gov.rs/handle/123456789/797780
Metadata source: (Preuzeto iz Nasi u WoS)
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