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Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs
| Title: | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs | Authors: | Danković, Danijel   ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2007 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 47 br. 9-11 str. 1400-1405 | DOI: | 10.1016/j.microrel.2007.07.022 | WoS-ID: | 000250604600017 | Scopus-ID: | 2-s2.0-34548765411 | URI: | https://enauka.gov.rs/handle/123456789/798705 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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