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Title: Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors
Authors: Davidovic, Vojkan S  ; Kouvatsos, DN; Stojadinovic, Ninoslav D; Voutsas, AT
Issue Date: 2007
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 47 br. 9-11 str. 1841-1845
DOI: 10.1016/j.microrel.2007.07.025
WoS-ID: 000250604600100
Scopus-ID: 2-s2.0-34548853691
URI: https://enauka.gov.rs/handle/123456789/798706
Metadata source: (Preuzeto iz Nasi u WoS)
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