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Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors
| Naziv: | Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors | Autori: | Davidovic, Vojkan S   ; Kouvatsos, DN; Stojadinovic, Ninoslav D; Voutsas, AT |
Godina: | 2007 | Publikacija: | MICROELECTRONICS RELIABILITY | ISSN: | 0026-2714 Microelectronics Reliability Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 47 br. 9-11 str. 1841-1845 | DOI: | 10.1016/j.microrel.2007.07.025 | WoS-ID: | 000250604600100 | Scopus-ID: | 2-s2.0-34548853691 | URI: | https://enauka.gov.rs/handle/123456789/798706 | Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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