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Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs
| Title: | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs | Authors: | Stojadinović, Ninoslav  ; Danković, Danijel  ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana |
Issue Date: | 2007 | Publication: | TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2 | Type: | Conference Paper | ISBN: | 978-86-85195-54-9  Search Idenfier |
Collation: | str. 275-282 | WoS-ID: | 000251017900052 | URI: | https://enauka.gov.rs/handle/123456789/798738 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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