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Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs
| Naziv: | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs | Autori: | Stojadinović, Ninoslav  ; Danković, Danijel  ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana |
Godina: | 2007 | Publikacija: | TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2 | Tip rezultata: | Konferencijski rad | ISBN: | 978-86-85195-54-9  Pretraži identifikator |
Kolacija: | str. 275-282 | WoS-ID: | 000251017900052 | URI: | https://enauka.gov.rs/handle/123456789/798738 | Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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