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New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs
| Title: | New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs | Authors: | Danković, Danijel   ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2008 | Publication: | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | Type: | Conference Paper | ISBN: | 978-1-4244-1881-7  Search Idenfier |
Collation: | str. 599-602 | DOI: | 10.1109/ICMEL.2008.4559357 | WoS-ID: | 000257432600128 | Scopus-ID: | 2-s2.0-51749088799 | URI: | https://enauka.gov.rs/handle/123456789/799298 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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