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eNauka >  Results >  Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements
Title: Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements
Authors: Jevtic, Milan M; Hadzi-Vukovic, Jovan M
Issue Date: 2007
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 47 br. 1 str. 51-58
DOI: 10.1016/j.microrel.2006.03.013
WoS-ID: 000244006500008
Scopus-ID: 2-s2.0-33845547129
URI: https://enauka.gov.rs/handle/123456789/799340
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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