Results
eNauka >
Results >
Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs
| Title: | Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs | Authors: | Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S   ; Golubovic, Snezana M; Stojadinovic, Ninoslav D |
Issue Date: | 2004 | Publication: | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2 | Type: | Conference Paper | Collation: | str. 701-704 | WoS-ID: | 000222219300149 | URI: | https://enauka.gov.rs/handle/123456789/803510 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
Google ScholarTM
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.