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On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering
| Title: | On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering | Authors: | Jelenkovic, Emil V; Jevtic, Milan M; Tong, KY; Pang, GKH; Cheung, WY; Jha, Shrawan K | Issue Date: | 2007 | Publication: | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | ISSN: | 1369-8001 Materials Science in Semiconductor Processing Search Idenfier |
Type: | Article | Collation: | vol. 10 br. 4-5 str. 143-149 | DOI: | 10.1016/j.mssp.2007.08.001 | WoS-ID: | 000255256000002 | Scopus-ID: | 2-s2.0-40949141104 | URI: | https://enauka.gov.rs/handle/123456789/805004 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 21M21 |
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