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eNauka >  Results >  The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements
Title: The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements
Authors: Hadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, H
Issue Date: 2008
Publication: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
ISSN: 1862-6300 Physica Status Solidi. A: Applications and Materials Science Search Idenfier
Type: Conference Paper
Collation: vol. 205 br. 11 str. 2544-2547
DOI: 10.1002/pssa.200780115
WoS-ID: 000261088200011
Scopus-ID: 2-s2.0-55849113277
URI: https://enauka.gov.rs/handle/123456789/805031
Metadata source: (Preuzeto iz Nasi u WoS)
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