The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements

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Naziv:	The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements
Autori:	Hadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, H
Godina:	2008
Publikacija:	PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
ISSN:	1862-6300 Physica Status Solidi. A: Applications and Materials Science Pretraži identifikator
Tip rezultata:	Konferencijski rad
Kolacija:	vol. 205 br. 11 str. 2544-2547
DOI:	10.1002/pssa.200780115
WoS-ID:	000261088200011
Scopus-ID:	2-s2.0-55849113277
URI:	https://enauka.gov.rs/handle/123456789/805031
Izvor metapodataka:	(Preuzeto iz Nasi u WoS)
M-kategorija:	Mp kategorija će biti prikazana naknadno.

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