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| Title: | Spontaneous recovery in DC gate bias stressed power VDMOSFETs | Authors: | Manić, Ivica   ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2006 | Publication: | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings | ISSN: | 2159-1660  Search Idenfier |
Type: | Conference Paper | Collation: | str. 639-644 | WoS-ID: | 000238839700133 | URI: | https://enauka.gov.rs/handle/123456789/808299 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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