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| Title: | Spontaneous recovery of positive gate bias stressed power VDMOSFETs | Authors: | Stojadinović, Ninoslav  ; Manić, Ivica  ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima |
Issue Date: | 2002 | Publication: | 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | Type: | Conference Paper | Collation: | str. 717-721 | WoS-ID: | 000176359700151 | URI: | https://enauka.gov.rs/handle/123456789/808360 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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