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| Title: | Effects of positive gate bias stress on radiation response in power VDMOSFETs | Authors: | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S   ; Golubovic, Snezana M |
Issue Date: | 2002 | Publication: | 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | Type: | Conference Paper | Collation: | str. 723-726 | WoS-ID: | 000176359700152 | URI: | https://enauka.gov.rs/handle/123456789/808362 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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