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eNauka >  Results >  A study of irradiation damage in commercial power MOSFETs by means of split C-V and conventional methods
Title: A study of irradiation damage in commercial power MOSFETs by means of split C-V and conventional methods
Authors: Mileusnic, S; Zivanov, Milos B; Habas, P
Issue Date: 2002
Publication: 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS
Type: Conference Paper
Collation: str. 763-766
WoS-ID: 000176359700161
URI: https://enauka.gov.rs/handle/123456789/808365
Metadata source: (Preuzeto iz Nasi u WoS)
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