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eNauka >  Results >  Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs
Title: Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs
Authors: Ristic, Goran S  ; Pejovic, Momcilo M; Jaksic, Aleksandar B
Issue Date: 2003
Publication: APPLIED SURFACE SCIENCE
ISSN: 0169-4332 Applied Surface Science Search Idenfier
Type: Article
Collation: vol. 220 br. 1-4 str. 181-185
DOI: 10.1016/S0169-4332(03)00818-3
WoS-ID: 000187721600023
Scopus-ID: 2-s2.0-0142248255
URI: https://enauka.gov.rs/handle/123456789/810468
Metadata source: (Preuzeto iz Nasi u WoS)
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