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Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy
| Title: | Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy | Authors: | Luna, Lunet E; Gardner, David; Radmilovic, Velimir R; Maboudian, Roya; Carraro, Carlo | Issue Date: | 2018 | Publication: | JOURNAL OF PHYSICAL CHEMISTRY C | ISSN: | 1932-7447 Journal of Physical Chemistry. C Search Idenfier |
Type: | Article | Collation: | vol. 122 br. 22 str. 12047-12051 | DOI: | 10.1021/acs.jpcc.8b01661 | WoS-ID: | 000435020300050 | Scopus-ID: | 2-s2.0-85046946666 | URI: | https://enauka.gov.rs/handle/123456789/813155 | Project: | National Science Foundation [1207053] University of California Berkeley Chancellor's Fellowship NSF Graduate Research Fellowship Gates Millennium Scholarship Serbian Academy of Sciences and Art [F141] Office of Science, Office of Basic Energy Science |
Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 21M21 |
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