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Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy
| Naziv: | Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy | Autori: | Luna, Lunet E; Gardner, David; Radmilovic, Velimir R; Maboudian, Roya; Carraro, Carlo | Godina: | 2018 | Publikacija: | JOURNAL OF PHYSICAL CHEMISTRY C | ISSN: | 1932-7447 Journal of Physical Chemistry. C Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 122 br. 22 str. 12047-12051 | DOI: | 10.1021/acs.jpcc.8b01661 | WoS-ID: | 000435020300050 | Scopus-ID: | 2-s2.0-85046946666 | URI: | https://enauka.gov.rs/handle/123456789/813155 | Projekat: | National Science Foundation [1207053] University of California Berkeley Chancellor's Fellowship NSF Graduate Research Fellowship Gates Millennium Scholarship Serbian Academy of Sciences and Art [F141] Office of Science, Office of Basic Energy Science |
Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
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