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eNauka >  Results >  Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling
Title: Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling
Authors: Videnovic-Misic, Mirjana S ; Jevtic, Milan M
Issue Date: 2008
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 48 br. 7 str. 1008-1014
DOI: 10.1016/j.microrel.2008.04.002
WoS-ID: 000259179900009
Scopus-ID: 2-s2.0-48349112293
URI: https://enauka.gov.rs/handle/123456789/814675
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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