Results
| Title: | New experimental evidence of latent interface-trap buildup in power VDMOSFETs | Authors: | Jaksic, Aleksandar B; Ristic, Goran S   ; Pejovic, Momcilo M |
Issue Date: | 2000 | Publication: | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | ISSN: | 0018-9499 IEEE Transactions on Nuclear Science Search Idenfier |
Type: | Article | Collation: | vol. 47 br. 3 str. 580-586 | DOI: | 10.1109/23.856483 | WoS-ID: | 000088378200018 | Scopus-ID: | 2-s2.0-0034205118 | URI: | https://enauka.gov.rs/handle/123456789/817730 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 21aM21a |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.