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eNauka >  Results >  Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs
Title: Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs
Authors: Jankovic, Nebojsa D; Young, Chadwin D
Issue Date: 2016
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 59 str. 26-29
DOI: 10.1016/j.microrel.2015.12.042
WoS-ID: 000374803200004
Scopus-ID: 2-s2.0-84953291563
URI: https://enauka.gov.rs/handle/123456789/820407
Project: Ministry of Education and Science Republic of Serbia [OI171026]
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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