Rezultati

eNauka >  Rezultati >  A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics
Title: A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics
Authors: Kwa, KSK; Chattopadhyay, S; Jankovic, Nebojsa D; Olsen, SH; Driscoll, LS; O'Neill, AG
Issue Date: 2003
Publication: SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN: 0268-1242 Semiconductor Science and Technology Search Idenfier
Type: Article
Collation: vol. 18 br. 2 str. 82-87
DOI: 10.1088/0268-1242/18/2/303
WoS-ID: 000181119400005
Scopus-ID: 2-s2.0-0037320050
URI: https://enauka.gov.rs/handle/123456789/820791
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
21M21

110
SCOPUSTM
91
OpenCitations
100
WEB OF SCIENCETM
Alt metrika
Dimensions
Unpaywall

Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.