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A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics
| Naziv: | A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics | Autori: | Kwa, KSK; Chattopadhyay, S; Jankovic, Nebojsa D; Olsen, SH; Driscoll, LS; O'Neill, AG | Godina: | 2003 | Publikacija: | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | ISSN: | 0268-1242 Semiconductor Science and Technology Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 18 br. 2 str. 82-87 | DOI: | 10.1088/0268-1242/18/2/303 | WoS-ID: | 000181119400005 | Scopus-ID: | 2-s2.0-0037320050 | URI: | https://enauka.gov.rs/handle/123456789/820791 | Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
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