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eNauka >  Results >  Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETs
Title: Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETs
Authors: Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana M
Issue Date: 2001
Publication: PROCEEDINGS OF THE 2001 8TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS
Type: Conference Paper
Collation: str. 243-248
DOI: 10.1109/IPFA.2001.941495
WoS-ID: 000171369600045
URI: https://enauka.gov.rs/handle/123456789/821945
Metadata source: (Preuzeto iz Nasi u WoS)
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