Results
| Title: | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs | Authors: | Stojadinovic, Ninoslav D; Manic, Ivica Dj   ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima |
Issue Date: | 2001 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Type: | Article | Collation: | vol. 41 br. 9-10 str. 1373-1378 | DOI: | 10.1016/S0026-2714(01)00143-3 | WoS-ID: | 000171384900018 | Scopus-ID: | 2-s2.0-0035456703 | URI: | https://enauka.gov.rs/handle/123456789/822184 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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