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eNauka >  Results >  Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing
Title: Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing
Authors: Ristic, Goran S  ; Pejovic, Momcilo M; Jaksic, Aleksandar B
Issue Date: 2006
Publication: APPLIED SURFACE SCIENCE
ISSN: 0169-4332 Applied Surface Science Search Idenfier
Type: Article
Collation: vol. 252 br. 8 str. 3023-3032
DOI: 10.1016/j.apsusc.2005.05.005
WoS-ID: 000235721800045
Scopus-ID: 2-s2.0-31144459484
URI: https://enauka.gov.rs/handle/123456789/827675
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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