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Title  : | Effects of electrical stressing in power VDMOSFETs | Authors: | Stojadinović, Ninoslav  ; Manić, Ivica  ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima |
Issue Date: | 2003 | Publication: | IEEE Conference on Electron Devices and Solid-State Circuits | Publisher: | IEEE | Type: | Conference Paper | Collation: | str. 291-296 | DOI: | 10.1109/EDSSC.2003.1283534 | WoS-ID: | 000189450800064 | Scopus-ID: | 2-s2.0-84946403753 | URI: | https://enauka.gov.rs/handle/123456789/827847 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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