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Title  : | Effects of electrical stressing in power VDMOSFETS | Authors: | Stojadinović, Ninoslav  ; Manić, Ivica  ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima |
Issue Date: | 2005 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 45 br. 1 str. 115-122 | DOI: | 10.1016/j.microrel.2004.09.002 | WoS-ID: | 000226442500014 | Scopus-ID: | 2-s2.0-10044269446 | URI: | https://enauka.gov.rs/handle/123456789/827848 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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